Drift Correction for Scanning-Electron Microscopy,
M.Eng. thesis, Department of Electrical Engineering and Computer Science, MIT, September 2010
Michael Snella pursued undergraduate degrees in both electrical engineering and physics at MIT. He was a member of the STIR group as well as the Quantum Nanostructures and Nanofabrication group at RLE.
His research prior to working to understand noise sources in scanning electron microscopy included the characterization of novel electron calorimeters for high energy physics applications.